The association for measurement professionals around the globe seeks papers that explore the successful deployment of 3D coordinate measurement systems, industry best practices, scientific research and developments, and initiatives associated with portable metrology and related applications. The 2014 CMSC will be held in North Charleston, S.C., from July 21 – 25, 2014. The Coordinate Metrology Society convenes each year at the CMSC, a unique event designed for users of portable, high-precision measurement technology utilized to inspect manufactured and assembled components on the factory floor.
CMS community members and metrology professionals in manufacturing, scientific research, and academia are encouraged to submit abstracts for technical papers and presentations by the deadline of March 14, 2014. Guidelines for presentations and technical papers can be downloaded at 2014 CMSC Guidelines. The CMS Executive Committee peer-reviews each abstract for presentation at CMSC 2014. Notification of acceptance will occur on April 4, 2014. For more information about presenting a technical paper at CMSC 2014, contact Scott Sandwith, Technical Presentations Coordinator at firstname.lastname@example.org. The CMS Executive Committee considers all technical papers presented at the CMSC, and selects the top papers for publication in the prestigious Journal of the CMSC.
At CMSC 2013, 26 expert presentations were delivered by industry leaders from The Boeing Co., NIST, NPL, FermiLab, API Services, University of Ontario Institute of Technology, Canada, Spirit Aerosystems, New River Kinematics, Lockheed Martin, Nuclear FiRST DTC, Rolls-Royce UTC, University of Manchester, The Nuclear AMRC, Variation Reduction Solutions Inc., Delcam, 3D Systems, LMI Technologies, 8 Tree, University of North Carolina, Dassault Systemes, ISRO Satellite Centre, ElectroImpact, East Coast Metrology, University of Bath, Coast Composites, and other companies and educational institutions covering technology, theory, and practice to advance the field of 3D metrology.